nobuy
CLCTB1
LanguageENG
PublishYear1998
publishCompany
Wiley
EISBN
9780471673279
PISBN
9780471143284
- Product Details
- Contents
- recommend
An Instructor's Manual presenting detailed solutions to all the problems in the book is available upon request from the Wiley editorial department.
- Contents
- Preface
- Acknowledgments
- 1. Reliability Concepts and Reliability Data
- 2. Models, Censoring, and Likelihood for Failure-Time Data
- 3. Nonparametric Estimation
- 4. Location-Scale-Based Parametric Distributions
- 5. Other Parametric Distributions
- 6. Probability Plotting
- 7. Parametric Likelihood Fitting Concepts: Exponential Distribution
- 8. Maximum Likelihood for Log-Location-Scale Distributions
- 9. Bootstrap Confidence Intervals
- 10. Planning Life Tests
- 11. Parametric Maximum Likelihood: Other Models
- 12. Prediction of Future Random Quantities
- 13. Degradation Data, Models, and Data Analysis
- 14. Introduction to the Use of Bayesian Methods for Reliability Data
- 15. System Reliability Concepts and Methods
- 16. Analysis of Repairable System and Other Recurrence Data
- 17. Failure-Time Regression Analysis
- 18. Accelerated Test Models
- 19. Accelerated Life Tests
- 20. Planning Accelerated Life Tests
- 21. Accelerated Degradation Tests
- 22. Case Studies and Further Applications
- Epilogue
- Appendix A. Notation and Acronyms
- Appendix B. Some Results from Statistical Theory
- Appendix C. Tables
- References
- Author Index
- Subject Index
Collected by
- Princeton University
- Yale University
- University of Oxford
- University of Melbourne Library
- Columbia University Library
- Stanford University
- University of Chicago
- MIT
- UCB
